Measurement Principle
Integrating-sphere spectrophotometry for accurate reflection and transmission measurements on flat, coated, textured and structured glass.

Spectral Configurations
350–1100 nm, 350–1700 nm or 350–2500 nm. The spectral configuration is selected according to the application and the optical properties that need to be characterized.

Reflection & Transmission
The T-Series supports spectral reflection and transmission measurements. The integrating sphere collects both direct and scattered light, enabling representative optical characterization of coated and structured substrates.

Measurement Speed
Typically below 1 second per spectrum. Acquisition time can be adjusted according to signal level, spectral range and application requirements.

Repeatability
Transmission repeatability down to 0.005%, depending on system configuration and measurement conditions.

Integrating Sphere
A large integrating sphere with a measurement port configured for the intended application. The sphere is designed to collect both direct and scattered light, enabling accurate measurements on flat, coated, textured and structured glass. Sphere size and measurement-port geometry can be adapted to the sample and measurement requirements.

For solar-glass applications, a typical configuration uses a 170 mm integrating sphere with a 60 mm measurement port, optimized for structured and scattering solar glass.

Substitution Error Correction
A secondary wall detector monitors the internal radiance of the integrating sphere. Changes in sphere conditions caused by introducing a sample are used to correct substitution error and improve measurement accuracy.

Sample Capability
Suitable for flat glass, structured glass, solar glass and coated glass. The system can measure selected positions on larger glass panels without cutting the sample.

Software
Flexible and configurable software supports laboratory R&D, coating development, process optimization and production quality control.

Optional Optical Modelling
Optical modelling can be added when deeper coating analysis is required, including determination of layer thickness and refractive index. For routine applications such as Low-E coating control, modelling is not required.

Configured Around Your Application

The PhotonMetra T-Series is not limited to one fixed configuration. Spectral range, measurement geometry, detector configuration, sample handling and software functionality can be adapted to the customer’s application and measurement requirements.

This allows each system to be optimized for the required accuracy, wavelength range, sample type and production environment. The objective is to provide the optimum measurement configuration for the application without adding unnecessary complexity.